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Papers Presented at ECASIA'07. Proceedings of the 12th European Conference on Applications of surface and Interface Analysis, 9-14 September 2007, Brussels, BelgiumPIREAUX, Jean-Jacques; WATTS, John F.Surface and interface analysis. 2008, Vol 40, Num 3-4, issn 0142-2421, 782 p.Conference Proceedings

Calculation of layer thickness on rough surfaces by polyhedral modelMOHAI, M.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 710-713, issn 0142-2421, 4 p.Conference Paper

Characterisation of the silicon nitride thin films deposited by plasma magnetronBATAN, A; FRANQUET, A; VEREECKEN, J et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 754-757, issn 0142-2421, 4 p.Conference Paper

Characterization challenges for nanomaterialsBAER, D. R; AMONETTE, J. E; SEAL, S et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 529-537, issn 0142-2421, 9 p.Conference Paper

Characterization of gold nanoclusters deposited on HOPG by atmospheric plasma treatmentDEMOISSON, Frédéric; RAES, Marc; TERRYN, Herman et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 566-570, issn 0142-2421, 5 p.Conference Paper

Characterization of near-field optical microscope probesKLAPETEK, Petr; VALTR, Miroslav; KLENOVSKY, Petr et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 482-485, issn 0142-2421, 4 p.Conference Paper

Conservation of polymers : a view to the futureABEL, Marie-Laure; COPPITTERS, Camille.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 445-449, issn 0142-2421, 5 p.Conference Paper

Determination of the effect of humidity and relative speed on the coefficient of friction using response surface methodologyABDO, Jamil; AL-RAWAHI, Nabeel.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 889-892, issn 0142-2421, 4 p.Conference Paper

Investigation of Mn-dimers formation in silicon by SIMS methodSARAYKIN, Vladimir; TRIFONOV, Alexey.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 486-489, issn 0142-2421, 4 p.Conference Paper

Investigation of methods to enhance the secondary ion yields in TOF-SIMS of organic samplesHEILE, A; LIPINSKY, D; VAN VAECK, L et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 538-542, issn 0142-2421, 5 p.Conference Paper

Phase transformation induced by classical ion implantation in austenitic stainless steelDUDOGNON, J; VAYER, M; PINEAU, A et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 772-775, issn 0142-2421, 4 p.Conference Paper

Pore structure of activated carbon prepared from hazelnut bagasse by chemical activationDEMIRAL, Hakan; DEMIRAL, Ilknur; TÜMSEK, Fatma et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 616-619, issn 0142-2421, 4 p.Conference Paper

Structural analysis of HgCdTe and PbSnTe native oxide filmsBERCHENKO, N. N; FRUGINSKII, M. S; KURILO, I. V et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 641-644, issn 0142-2421, 4 p.Conference Paper

A novel ATR-FTIR method for functionalised surface characterisationANDERSSON, Per Ola; LIND, Per; MATTSSON, Andreas et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 623-626, issn 0142-2421, 4 p.Conference Paper

A resonant photoelectron spectroscopy study of Sn(Ox) doped CeO2 catalystsMATOLIN, V; CABALA, M; CHKB, V et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 225-230, issn 0142-2421, 6 p.Conference Paper

Analysis of the oil-water interface byXPS at low temperatureGENET, M. J; COGELS, P; ADRIAENSEN, Y et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 338-342, issn 0142-2421, 5 p.Conference Paper

Behaviour of T16A14V implant alloy in vitro after plastic deformation by bendingKIERZKOWSKA, Agnieszka; KRASICKA-CYDZIK, Elzbieta.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 507-512, issn 0142-2421, 6 p.Conference Paper

Ce 3d XPS investigation of cerium oxides and mixed cerium oxide (CexTiyOz)BECHE, Eric; CHARVIN, Patrice; PERARNAU, Danielle et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 264-267, issn 0142-2421, 4 p.Conference Paper

Cleaning of albumin-contaminated Ti and Cr surfaces : an XPS and QCM studyPAYET, Vincent; BRUNNER, Susanne; GALTAYRIES, Anouk et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 215-219, issn 0142-2421, 5 p.Conference Paper

Comparison between XPS-and FTIR-analysis of plasma-treated polypropylene film surfacesMORENT, R; DE GEYTER, N; LEYS, C et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 597-600, issn 0142-2421, 4 p.Conference Paper

Influence of polyvinylpyrolidone as an additive in electrochemical preparation of ZnO nanowires and nanostructured thin filmsENCULESCU, Ionut; MATEI, Elena; SIMA, Mariana et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 556-560, issn 0142-2421, 5 p.Conference Paper

Insulator nanocapillary production from biological sampleBERECZKY, R. J; TÖKESI, K; VARGA, D et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 584-587, issn 0142-2421, 4 p.Conference Paper

Interfacial studies of Al2O3 deposited on 4H-SiC(0001)DIPLAS, Spyros; AVICE, Marc; THOGERSEN, Annett et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 822-825, issn 0142-2421, 4 p.Conference Paper

Optical trigger based on the molecules of bacteriorhodopsin adsorbed on AgBr nanocrystalsZAKHAROV, V. N; KUDRYAVTSEV, I. K; ASLANOV, L. A et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 495-497, issn 0142-2421, 3 p.Conference Paper

Reactive deposition of TiNx layers in a DC-magnetron dischargeWREHDE, Stefan; QUAAS, Marion; BOGDANOWICZ, Robert et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 790-793, issn 0142-2421, 4 p.Conference Paper

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